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Atomic Force Microscopes

Atomic Force Microscopes

Product Details:


Product Description

Atomic Force Microscopes

  1. Delivering high-performance TERS with complete SPM capabilities
  2. Offering performance exclusively enabled by DIDAC commercially available TERS probes
  3. Providing productive measurement with guaranteed TERS performance

Technical Details:

1. Easiest to Use AFM for Spectroscopy in Nanostructured Materials

  • Ergonomic hardware and streamlined software with integrated setup diagnostics deliver instant research quality results
  • Experiment Selector distills decades of knowledge into preconfigured settings, mitigating the complexity of traditional TERS setups

2. Highest Performance, Most Complete AFM Capabilities

  • Fully featured suite of advanced topographic, electrical, mechanical, and thermal AFM capabilities enables correlated property mapping
  • System design for noise and drift elimination enables high-resolution imaging and long Raman integration times

3. True Nanoscale Spectroscopy Targeted to Your Application

  • Modular accessories tailor system to targeted applications
  • Optimized optical access enables capture of weak Raman signals for nanoscale chemical mapping, even on challenging samples


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Contact Details
Regd. Office Address : 507, Shahpuri Tower, C- 58, Janakpuri, New Delhi - 110058, India
Phone :+918037304424
Mr. A. Kumar (MD)
Mobile :918037304424
Factory: Didac Mension, Phase 1, Mangolpuri Industrial Area, New Delhi-83 INDIA 0091 78381 16798
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