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Spectroscopic Ellipsometer

Spectroscopic Ellipsometer

Product Details:


Product Description

Description of Spectroscopic Ellipsometer

The Spectroscopic Ellipsometer range offers the best combination of modularity and performance for thin film characterizations. Based on phase modulation technology, the Spectroscopic Ellipsometer delivers high accuracy and high resolution measurements with an excellent signal to noise ratio. Spectroscopic Ellipsometer offer a modular design, enabling the best fit to your applications. Four spectral ranges are available covering wavelengths from 190 to 2100nm. Full automation, a large variety of accessories and integrated microspot optics make the a powerful and versatile Spectroscopic Ellipsometer for demanding research and industrial quality control.

Features of Spectroscopic Ellipsometer

  1. Highest precision, sensitivity, and resolution
  2. Large spectral range: 190-2100 nm
  3. Modular design
  4. Fully integrated software package
  5. Thin film thickness from 1Å to >45µm
  6. Optical constants (n,k) for isotropic, anisotropic, and graded films
  7. Surface and interface roughness
  8. Derived optical properties such as absorption coefficient α and optical bandgap Eg
  9. Material properties: compound alloy composition, porosity, crystallinity, morphology, uniformity
  10. Mueller matrix
  11. Depolarization


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Contact Details
Regd. Office Address : 507, Shahpuri Tower, C- 58, Janakpuri, New Delhi - 110058, India
Phone :+918037304424
Mr. A. Kumar (MD)
Mobile :918037304424
Factory: Didac Mension, Phase 1, Mangolpuri Industrial Area, New Delhi-83 INDIA 0091 78381 16798
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