Dimension Edge Atomic Force Microscopes

Product Description

Dimension Edge Atomic Force Microscopes

1. Delivering best-in-class performance on any AFM sample
2. Providing high measurement reproducibility for materials
3. Incorporating ScanAsyst self-optimizing mode for easiest AFM imaging

Technical Details:

1. Highest Productivity for Any User

• Proprietary ScanAsyst imaging enables instant expert results
• High-resolution, 5MP camera and integrated stage control provide fast sample navigation and efficient multi-site measurment
• Linear workflow and seamless transition from survey to highest resolution delivers accurate results in a short time

2. Best Value Closed-Loop Dimension AFM

• Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
• Significantly reduced noise and drift values bring small-sample imaging performance to a large-sample AFM
• Modular microscope and electronics design enable high image fidelity at moderate cost