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Sequential Fluorescence Spectrometer

Sequential Fluorescence Spectrometer

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Product Description

Sequential Fluorescence Spectrometer

With spirit of a pioneer of local analysis, mapping and 4 kW thin-window X-ray tube, brush up these technologies with reviewing hardware and software, and achieve more reliable, more operative and more functional system.

Features of Sequential Fluorescence Spectrometer

  1. World first 250µm Mapping for wavelength dispersive analysis. This enables to analyze content distribution and intensity distribution of non uniform sample.
  2. Qualitative/quantitative analysis using higher-order X-rays. More accurate evaluation of higher-order X-rays makes higher.
  3. Film thickness measurement and inorganic component analysis for high-polymer thin films with background FP method .
  4. CCD camera option for sample position designation.
  5. 4 kW thin-window X-ray tube for high reliability and long life. Compared with conventional 3 kW tube, more than double of sensitivity is achieve in light elements.
  6. Ease of use – template and matching functions based on expertise. Optimal conditions can be created based on prepared conditions for sample forms like liquid, powder, solid, metal and oxides.


DIDAC INTERNATIONAL

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Contact Details
Regd. Office Address : 507, Shahpuri Tower, C- 58, Janakpuri, New Delhi - 110058, India
Phone :+918037304424
Mr. A. Kumar (MD)
Mobile :918037304424
Factory: Didac Mension, Phase 1, Mangolpuri Industrial Area, New Delhi-83 INDIA 0091 78381 16798
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