SiBrickScan (SBS) is a dedicated at-line system for the FTIR quantification of interstitial Oxygen in complete Silicon ingots, resulting in a concentration profile along the longitudinal axis. Accessing this information without sawing wafers or test samples is a major and cost saving advantage.
SBS is available for poly or mono crystalline standard square PV ingots (cross section ~156 x 156 mm2) as well as for cylindric Si ingots e.g. with ~150 mm (6") or ~200 mm (8") diameter. Systems for other diameters & shapes might be available on request.