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Description of Spectroscopic Ellipsometer
The Spectroscopic Ellipsometer range offers the best combination of modularity and performance for thin film characterizations. Based on phase modulation technology, the Spectroscopic Ellipsometer delivers high accuracy and high resolution measurements with an excellent signal to noise ratio. Spectroscopic Ellipsometer offer a modular design, enabling the best fit to your applications. Four spectral ranges are available covering wavelengths from 190 to 2100nm. Full automation, a large variety of accessories and integrated microspot optics make the a powerful and versatile Spectroscopic Ellipsometer for demanding research and industrial quality control.
Features of Spectroscopic Ellipsometer