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X Ray Metrology JV DX

X Ray Metrology JV DX

Product Details:

  • Supply Ability : as per requirement Per Month
1000.00 - 10000.00 INR
X

Price And Quantity

  • 1 Piece
  • 1000.00 - 10000.00 INR

Trade Information

  • as per requirement Per Month
  • 10 to 30 Days

Product Description

X Ray Metrology JV DX

 

The DIDAC JV-DX is the latest generation of X-ray metrology  system for semiconductor thin film analysis for materials’ research, process development and quality control. Featuring fully automated source optics, the system can switch between standard XRD, High-Resolution, and X-ray reflectivity modes without user intervention. Measurements are fully automated within recipes with the ability to also perform more esoteric measurements in semi-manual mode.

 

The instrument is designed for a variety of thin-film applications, including high resolution rocking curves, reciprocal space mapping, X-ray topography (digital imaging), X-ray reflectivity, Grazing Incidence XRD, Phase ID, residual stress, film texture and grain size analysis. The sample stage consists of a robust 5-axis Eulerian cradle, with full 300 mm wafer mapping, and capacity for both large and small samples. Multiple sample locations for smaller samples are provided to enable multiple measurements across multiple samples to be queued and performed automatically, even of different measurement types. Leading edge data analysis packages, such as JV-RADS and JV-REFS, provide expert data presentation and interpretation. 


DIDAC INTERNATIONAL

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Contact Details
Regd. Office Address : 507, Shahpuri Tower, C- 58, Janakpuri, New Delhi - 110058, India
Phone :+918037304424
Mr. A. Kumar (MD)
Mobile :918037304424
Factory: Didac Mension, Phase 1, Mangolpuri Industrial Area, New Delhi-83 INDIA 0091 78381 16798
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